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TriboAETM Calibration Sample
Theseprobes also have a tip radius (< 20 nm) which is difficult toroutinely obtain by standard AFM probe processing methods
creating a film with varying material properties
and holder model VITA-CH-MM-HE when used withMultiMode AFMs
- Suitable for use with TERS-STM probes and Innova-IRIS
SMIM-300 FastScan™ TriboAETM Calibration SamplesMIM probes, 19 kHz, 1 N m, 5 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Nitride probe with shielded co axial sensor for sMIM. Nominal 18 kHz, 1 N m 5 Probes Tip Geometry: Pyramid Tip Height: 4. 5 5. 5 Front Angle: 35 1 Back Angle: 35 1 Side Angle: 35 1 Tip Radius (Nom): 50 10 Tip Coating: TiW Cantilever Material: Silicon Nitride Cantilever Thickness (Nom): 3. 6 Cantilever Thickness (RNG): 3. 3 3. 9 Cantilever Geometry: Rectangular
