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instrumentation used
Takes less space with a head diameter of 6
16216 - Specimen Mount
16011 - Ø1" Silicon Wafer
the hard Cobalt-Chromium coating on this tip is tailored for high-sensitivity and magnetic contrast
PELCO® NiOx Test Specimen for Analytical Electron Microscopy (AEM) Soft Tapping Mode instrumentation usedDESCRIPTION inexpensive characterization of instrument performance The NiOx Test Specimen has been developed for advanced analytical TEM's equipped with X Ray Micro Analysis Systems (EDX) and or Electron Energy Loss Spectrometers (EELS) to characterize instrument performance. It consists of a 55nm layer of NiOx on a 25nm carbon support film on a 200 mesh Mo TEM grid. The NiOx Test Specimen is valuable in at least three ways: When evaluating TEM's and
